amphenol代理商
專業(yè)銷售Amphenol（安費諾）全系列產(chǎn)品-英國2號倉庫
美國1號分類選型新加坡2號分類選型英國10號分類選型英國2號分類選型日本5號分類選型

在本站結(jié)果里搜索：    
熱門搜索詞:  Connectors  8910DPA43V02  Amphenol  UVZSeries 160VDC  70084122  IM21-14-CDTRI

S-2-K-4-D - 

SPRING CONTACT PROBE

Smiths Interconnect Americas, Inc. S-2-K-4-D
聲明：圖片僅供參考，請以實物為準(zhǔn)！
制造商產(chǎn)品編號：
S-2-K-4-D
倉庫庫存編號：
70009399
技術(shù)數(shù)據(jù)表：
View S-2-K-4-D Datasheet Datasheet
訂購熱線： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于產(chǎn)品數(shù)據(jù)庫龐大，部分產(chǎn)品信息可能未能及時更新，下單前請與銷售人員確認好實時在庫數(shù)量，謝謝合作！

S-2-K-4-D產(chǎn)品概述

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.
  • Tip Style: Chisel
  • Maximum Travel: 0.160 (4.06) In.(mm)
  • Spring Force: 4.0 Oz. @ 0.100 (2.54) In.(mm)

    • S-2-K-4-D產(chǎn)品信息

      Brand/Series  S-2 Series  
      Centerline, Spacing  0.100 (2.54) In.(mm) In.(mm)  
      Contact Resistance  35 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Force, Spring  4.0 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.970 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Duralloy Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Beryllium Copper  
      Maximum Travel  0.160 In.  
      Minimum Centers  0.100 In.  
      Primary Type  Probe  
      Size  Size 2  
      Tip Style  K - Chisel 45 Deg  
      Type  Connector Probe  
    關(guān)鍵詞         

    S-2-K-4-D關(guān)聯(lián)產(chǎn)品

    • 參考圖片
    • 制造商 / 說明 / 型號 / 倉庫庫存編號
    • PDF
    • 操作

    S-2-K-4-D相關(guān)搜索

    Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Brand/Series S-2 Series  Spring Test Probes Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series S-2 Series   Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)   Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Force, Spring 4.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 4.0 Oz. Oz.  Spring Test Probes Force, Spring 4.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 4.0 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.970 In. In.  Spring Test Probes Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.970 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Duralloy Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Duralloy Plated (Plunger)  Spring Test Probes Material, Plating Duralloy Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Duralloy Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Spring Beryllium Copper  Spring Test Probes Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Beryllium Copper   Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.160 In.  Spring Test Probes Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.160 In.   Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.100 In.  Spring Test Probes Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.100 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Size Size 2  Smiths Interconnect Americas, Inc. Size Size 2  Spring Test Probes Size Size 2  Smiths Interconnect Americas, Inc. Spring Test Probes Size Size 2   Tip Style K - Chisel 45 Deg  Smiths Interconnect Americas, Inc. Tip Style K - Chisel 45 Deg  Spring Test Probes Tip Style K - Chisel 45 Deg  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style K - Chisel 45 Deg   Type Connector Probe  Smiths Interconnect Americas, Inc. Type Connector Probe  Spring Test Probes Type Connector Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Type Connector Probe  
    電話:400-900-3095
    QQ:800152669
    關(guān)于我們 | Amphenol簡介 | Amphenol產(chǎn)品 | Amphenol產(chǎn)品應(yīng)用 | Amphenol動態(tài) | 按系列選型 | 按產(chǎn)品規(guī)格選型 | Amphenol選型手冊 | 付款方式 | 聯(lián)系我們
    Copyright © 2017 training-know-how.com All Rights Reserved. 技術(shù)支持：電子元器件 ICP備案證書號:粵ICP備11103613號