amphenol代理商
專業(yè)銷售Amphenol（安費諾）全系列產品-英國2號倉庫
庫存查詢
美國1號分類選型新加坡2號分類選型英國10號分類選型英國2號分類選型日本5號分類選型

在本站結果里搜索：    
熱門搜索詞:  Connectors  8910DPA43V02  Amphenol  UVZSeries 160VDC  70084122  IM21-14-CDTRI

S-2-H-7-G - 

Spring Contact Probe .100 (size 2) centerline spacing waffle

Smiths Interconnect Americas, Inc. S-2-H-7-G
聲明：圖片僅供參考，請以實物為準！
制造商產品編號：
S-2-H-7-G
倉庫庫存編號：
70009186
技術數據表：
View S-2-H-7-G Datasheet Datasheet
訂購熱線： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于產品數據庫龐大，部分產品信息可能未能及時更新，下單前請與銷售人員確認好實時在庫數量，謝謝合作！

S-2-H-7-G產品概述

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.
  • Tip Style: Serrated
  • Maximum Travel: 0.160 (4.06) In.(mm)
  • Spring Force: 7.0 Oz. @ 0.100 (2.54) In.(mm)

    • S-2-H-7-G產品信息

      Brand/Series  S-2 Series  
      Centerline, Spacing  0.100 (2.54) In.(mm) In.(mm)  
      Contact Resistance  35 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Force, Spring  7.0 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.970 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Beryllium Copper  
      Maximum Travel  0.160 In.  
      Minimum Centers  0.100 In.  
      Primary Type  Probe  
      Size  Size 2  
      Tip Style  H - Serrated 9Pt.  
      Type  Connector Probe  
    關鍵詞         

    S-2-H-7-G關聯產品

    • 參考圖片
    • 制造商 / 說明 / 型號 / 倉庫庫存編號
    • PDF
    • 操作

    S-2-H-7-G客戶還搜索了

    • 參考圖片
    • 制造商 / 說明 / 型號 / 倉庫庫存編號
    • PDF
    • 操作

    S-2-H-7-G相關搜索

    Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Brand/Series S-2 Series  Spring Test Probes Brand/Series S-2 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series S-2 Series   Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.100 (2.54) In.(mm) In.(mm)   Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Force, Spring 7.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 7.0 Oz. Oz.  Spring Test Probes Force, Spring 7.0 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 7.0 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.970 In. In.  Spring Test Probes Length, Overall 0.970 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.970 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Spring Beryllium Copper  Spring Test Probes Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Beryllium Copper   Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.160 In.  Spring Test Probes Maximum Travel 0.160 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.160 In.   Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.100 In.  Spring Test Probes Minimum Centers 0.100 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.100 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Size Size 2  Smiths Interconnect Americas, Inc. Size Size 2  Spring Test Probes Size Size 2  Smiths Interconnect Americas, Inc. Spring Test Probes Size Size 2   Tip Style H - Serrated 9Pt.  Smiths Interconnect Americas, Inc. Tip Style H - Serrated 9Pt.  Spring Test Probes Tip Style H - Serrated 9Pt.  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style H - Serrated 9Pt.   Type Connector Probe  Smiths Interconnect Americas, Inc. Type Connector Probe  Spring Test Probes Type Connector Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Type Connector Probe  
    電話:400-900-3095
    QQ:800152669
    關于我們 | Amphenol簡介 | Amphenol產品 | Amphenol產品應用 | Amphenol動態(tài) | 按系列選型 | 按產品規(guī)格選型 | Amphenol選型手冊 | 付款方式 | 聯系我們
    Copyright © 2017 www.training-know-how.com All Rights Reserved. 技術支持：電子元器件 ICP備案證書號:粵ICP備11103613號