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S-0-B9-2.2-G - 

0.050 INCH CENTERLINE SPACING SPRING CONTACT PROBE 90 DEGREE SPEAR TIP

Smiths Interconnect Americas, Inc. S-0-B9-2.2-G
聲明：圖片僅供參考，請以實物為準！
制造商產(chǎn)品編號：
S-0-B9-2.2-G
倉庫庫存編號：
70009067
技術(shù)數(shù)據(jù)表：
View S-0-B9-2.2-G Datasheet Datasheet
訂購熱線： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于產(chǎn)品數(shù)據(jù)庫龐大，部分產(chǎn)品信息可能未能及時更新，下單前請與銷售人員確認好實時在庫數(shù)量，謝謝合作！

S-0-B9-2.2-G產(chǎn)品概述

Single Ended Non-Rotating Coax Probes, 3 A Continuous Current Rating
  • Minimum center 0.050 "
  • Maximum travel 0.1 "
    Probe with gold plated plunger material.

    • S-0-B9-2.2-G產(chǎn)品信息

      Brand/Series  S-0 Series  
      Centerline, Spacing  0.050 (1.27) In.(mm) In.(mm)  
      Contact Resistance  35 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  3 A A  
      Diameter, Mounting Hole  0.021 in.  
      Force, Spring  2.2 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.66 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Beryllium Copper  
      Maximum Travel  0.1 In.  
      Minimum Centers  0.05 In.  
      Primary Type  Probe  
      Size  Size 0  
      Tip Style  B9 - Spear 90 Deg  
      Type  General Purpose  
      Working Travel  0.07  
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    S-0-B9-2.2-G關(guān)聯(lián)產(chǎn)品

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    S-0-B9-2.2-G相關(guān)搜索

    Brand/Series S-0 Series  Smiths Interconnect Americas, Inc. Brand/Series S-0 Series  Spring Test Probes Brand/Series S-0 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series S-0 Series   Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.050 (1.27) In.(mm) In.(mm)   Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 35 Milliohms (Max.) Milliohms (Max.)   Current Rating 3 A A  Smiths Interconnect Americas, Inc. Current Rating 3 A A  Spring Test Probes Current Rating 3 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A   Diameter, Mounting Hole 0.021 in.  Smiths Interconnect Americas, Inc. Diameter, Mounting Hole 0.021 in.  Spring Test Probes Diameter, Mounting Hole 0.021 in.  Smiths Interconnect Americas, Inc. Spring Test Probes Diameter, Mounting Hole 0.021 in.   Force, Spring 2.2 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 2.2 Oz. Oz.  Spring Test Probes Force, Spring 2.2 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 2.2 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.66 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.66 In. In.  Spring Test Probes Length, Overall 0.66 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.66 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Spring Beryllium Copper  Spring Test Probes Material, Spring Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Beryllium Copper   Maximum Travel 0.1 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.1 In.  Spring Test Probes Maximum Travel 0.1 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.1 In.   Minimum Centers 0.05 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.05 In.  Spring Test Probes Minimum Centers 0.05 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.05 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Size Size 0  Smiths Interconnect Americas, Inc. Size Size 0  Spring Test Probes Size Size 0  Smiths Interconnect Americas, Inc. Spring Test Probes Size Size 0   Tip Style B9 - Spear 90 Deg  Smiths Interconnect Americas, Inc. Tip Style B9 - Spear 90 Deg  Spring Test Probes Tip Style B9 - Spear 90 Deg  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style B9 - Spear 90 Deg   Type General Purpose  Smiths Interconnect Americas, Inc. Type General Purpose  Spring Test Probes Type General Purpose  Smiths Interconnect Americas, Inc. Spring Test Probes Type General Purpose   Working Travel 0.07  Smiths Interconnect Americas, Inc. Working Travel 0.07  Spring Test Probes Working Travel 0.07  Smiths Interconnect Americas, Inc. Spring Test Probes Working Travel 0.07  
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