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100410-005 BIAS W/HOLE 6.2OZ. - 

6.2OZ SPRING FORCE RATED STROKE BATTERYCONTACT PROBE

Smiths Interconnect Americas, Inc. 100410-005 BIAS W/HOLE 6.2OZ.
聲明：圖片僅供參考，請以實物為準(zhǔn)！
制造商產(chǎn)品編號：
100410-005 BIAS W/HOLE 6.2OZ.
倉庫庫存編號：
70009130
技術(shù)數(shù)據(jù)表：
View 100410-005 BIAS W/HOLE 6.2OZ. Datasheet Datasheet
訂購熱線： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于產(chǎn)品數(shù)據(jù)庫龐大，部分產(chǎn)品信息可能未能及時更新，下單前請與銷售人員確認(rèn)好實時在庫數(shù)量，謝謝合作！

100410-005 BIAS W/HOLE 6.2OZ.產(chǎn)品概述

Thermocouple Adapter, Voltage Rating 30 VAC/60 VDC
  • Mounting flange
  • Bias ball
    0.060 " Working travel.

    • 100410-005 BIAS W/HOLE 6.2OZ.產(chǎn)品信息

      Brand/Series  100410 Series  
      Centerline, Spacing  0.175 (4.45) In.(mm) In.(mm)  
      Contact Resistance  10 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  10 A A  
      Diameter, Hole  0.020 In.  
      Force, Spring  6.2 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.395 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Bias Ball  Stainless Steel  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Stainless Steel  
      Maximum Travel  0.090 In.  
      Minimum Centers  0.175 In.  
      Primary Type  Probe  
      Tip Style  Spherical Radius  
      Type  Battery Contact  
      Working Travel  0.06  
    關(guān)鍵詞         

    100410-005 BIAS W/HOLE 6.2OZ.關(guān)聯(lián)產(chǎn)品

    • 參考圖片
    • 制造商 / 說明 / 型號 / 倉庫庫存編號
    • PDF
    • 操作

    100410-005 BIAS W/HOLE 6.2OZ.相關(guān)搜索

    Brand/Series 100410 Series  Smiths Interconnect Americas, Inc. Brand/Series 100410 Series  Spring Test Probes Brand/Series 100410 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 100410 Series   Centerline, Spacing 0.175 (4.45) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.175 (4.45) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.175 (4.45) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.175 (4.45) In.(mm) In.(mm)   Contact Resistance 10 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 10 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 10 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 10 Milliohms (Max.) Milliohms (Max.)   Current Rating 10 A A  Smiths Interconnect Americas, Inc. Current Rating 10 A A  Spring Test Probes Current Rating 10 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 10 A A   Diameter, Hole 0.020 In.  Smiths Interconnect Americas, Inc. Diameter, Hole 0.020 In.  Spring Test Probes Diameter, Hole 0.020 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Diameter, Hole 0.020 In.   Force, Spring 6.2 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 6.2 Oz. Oz.  Spring Test Probes Force, Spring 6.2 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 6.2 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.395 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.395 In. In.  Spring Test Probes Length, Overall 0.395 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.395 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Bias Ball Stainless Steel  Smiths Interconnect Americas, Inc. Material, Bias Ball Stainless Steel  Spring Test Probes Material, Bias Ball Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Bias Ball Stainless Steel   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel  Spring Test Probes Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel   Maximum Travel 0.090 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.090 In.  Spring Test Probes Maximum Travel 0.090 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.090 In.   Minimum Centers 0.175 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.175 In.  Spring Test Probes Minimum Centers 0.175 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.175 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Tip Style Spherical Radius  Smiths Interconnect Americas, Inc. Tip Style Spherical Radius  Spring Test Probes Tip Style Spherical Radius  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Spherical Radius   Type Battery Contact  Smiths Interconnect Americas, Inc. Type Battery Contact  Spring Test Probes Type Battery Contact  Smiths Interconnect Americas, Inc. Spring Test Probes Type Battery Contact   Working Travel 0.06  Smiths Interconnect Americas, Inc. Working Travel 0.06  Spring Test Probes Working Travel 0.06  Smiths Interconnect Americas, Inc. Spring Test Probes Working Travel 0.06  
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